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... production enterprises in the upstream of the semiconductor industry chain, the independently developed spectral confocal measurement system is used to detect the size and flatness of semiconductor raw and epitaxial wafers. Product ...
... measurement principle with precision image analysis algorithms, equipped with double telecentric optical lens with high depth of field, VX8000 series of Flash Measuring Machines achieve fast dimensional ...
Chotest Technology Inc.
... measurement principle with precision image analysis algorithms, equipped with double telecentric optical lens with high depth of field, VX8000 series of Flash Measuring Machines achieve fast dimensional ...
Chotest Technology Inc.
... intersectant point, coordinate axis, straight line, vertical line, circle and circular cross section, and analyze the straightness, roundness of contour; More functions: (1)Establish a regression line and a circle ...
Chotest Technology Inc.
... simpler than this. Choose the single-image field system of the V-CAD 60 (this covers a measuring range of up to 65 x 55 mm, without table movement), or the larger variant with moving table (V-CAD 300) and measuring ...
... small parts and micro-components. Fixed or sliding stage? Download the specifications and choose your measuring field. METRIOS HD measuring system Highest resolution of the range. Capture the smallest ...
METRIOS
... Repeatability（μm） : 1.0 • CCD : Color Camera • Magnification : Lens 0.7X-4.5X,Monitor magnification :40X-245X • Working distance : 82mm • Software : JINUOSH A-VM SYSTEM software • Linear scale ...
Guangdong Jinuosh Technology Co.,Ltd
... for height, depth and other 3 D measurement ■ Optional THK linear guide and ball screw ■ Optional KEYENCE laser displacement sensor for roughness, flatness surface measurement ■ Optional spectral confocal ...
Leader Precision Instrument Co. Ltd
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