Semiconductor testing devices

3 companies | 7 products
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capacitance testing device
capacitance testing device
4200A-SCS

... Accelerate research, reliability and failure analysis studies of semiconductor devices, materials and process development with the 4200A-SCS. The highest performance parameter analyzer, it delivers synchronizing current-voltage ...

automatic test equipment
automatic test equipment
VIP Ultra

... Overview
The VIP Ultra by Cosmic is a next-generation automatic test equipment (ATE) for high-throughput testing of power semiconductors (Si, SiC, GaN). Designed for cleanroom ...

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Cosmic Equipment S.p.A.
automatic test equipment
automatic test equipment
DMT EVO

... Overview
DMT EVO is a compact mixed‑signal and digital automatic test equipment (ATE) designed for efficient IC characterization and validation across R&D, lab, pre‑production and post‑production stages. The ...

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Cosmic Equipment S.p.A.
automatic test equipment
automatic test equipment
Quasar200

... for DC and AC characterization of Si, GaN and SiC devices. Quasar200 targets Si, GaN and lower-power SiC; Pulsar600 targets ultra-high current applications including SiC, inverter and automotive testing.

Key ...

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Cosmic Equipment S.p.A.
burn-in test equipment
burn-in test equipment

... alternative to traditional burn‑in ovens. Designed for high‑density device testing, the platform pairs a Burn‑In System (BIS) with racks featuring 24 internal slots (each slot can host up to 120 devices) ...

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Cosmic Equipment S.p.A.
automatic test equipment
automatic test equipment
Hatina 4S

... configuration optimized for MEMS devices (accelerometers, gyroscopes, pressure, temperature, humidity, gas sensors)

  • Hatina 4S Microphone — New Era microphone system with audio modules and AWG per site for MEMS
  • ...

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    Cosmic Equipment S.p.A.
    carrier concentration testing device
    carrier concentration testing device
    DX-3000

    ... Features of DX-3000 Hall Effect Device: - Using plug-sample cards, easy to install; - One standard configuration can simultaneously measure two samples, and 4 samples can be measured simultaneously by adding optional devices; ...

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