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Magnification: 40 unit - 300,000 unit
Resolution: 4 nm - 8 nm
Weight: 120 kg
... Product name: Scanning Electron
Microscope
Magnification (electron image): 40×–300,000× (large area stitching optional)
Maximum sample size (W × L × H): 70 mm × 70 mm × 45 mm
Filament / Electron gun:
Tungsten ...
... TESCAN VEGA’s 4th generation Scanning Electron Microscope (SEM) with tungsten filament electron source combines SEM imaging and live elemental composition analysis in a single window ...
Magnification: 300,000 unit
Resolution: 4, 7, 3 nm
Weight: 480 kg
... Brightness & Contrast, Auto Focus, Automatic Stigmator The CIQTEK SEM3200 SEM Microscope is an excellent general-purpose Tungsten Filament Scanning Electron Microscope ...
CIQTEK Co., Ltd.
Magnification: 300,000 unit
Resolution: 4.5, 3.9 nm
... CIQTEK SEM2100 SEM Microscope Specifications Electron Optics Resolution: 3.9 nm @ 20 kV, SE 4.5 nm @ 20 kV, BSE Accelerating Voltage: 0.5 kV ~ 30 kV Magnification (Polaroid): 1 x ~ 300,000 x Specimen ...
CIQTEK Co., Ltd.
Magnification: 1 unit - 2,500,000 unit
Resolution: 0.6 nm - 1 nm
Weight: 400 kg
... CIQTEK SEM5000X FESEM Microscope Specifications Electron Optics Resolution: 0.6 nm @ 15 kV, SE 1.0 nm @ 1 kV, SE Acceleration Voltage: 0.02kV ~30 kV Magnification: 1 ~ 2,500,000 x Electron Gun Type: Schottky ...
CIQTEK Co., Ltd.
Magnification: 1 unit - 300,000 unit
Resolution: 2.5 nm - 5 nm
Length: 926 mm
... resolution limit of such SEM is surpassed, enabling the tungsten filament SEM to perform low-voltage analysis tasks previously only achievable with field emission SEMs. *Break Through ...
CIQTEK Co., Ltd.
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