Mixed-signal tester DMT EVO

integrated circuitR&Dfor production

Overview
DMT EVO is a compact mixed‑signal and digital automatic test equipment (ATE) designed for efficient IC characterization and validation across R&D, lab, pre‑production and post‑production stages. The system uses a modular mainframe with up to 5 slots to combine power sources, digital modules, AWG/digitizers and measurement units in a single scalable platform. Control is via an intuitive graphical user interface and accelerated by Kronos, an automatic test program generator.

Key advantages

• Extremely compact footprint enabling dense resource integration for lab and pre‑production environments.
• Kronos automatic code generator to reduce test development time and speed time‑to‑market.
• Integrated debug tools including an oscilloscope for troubleshooting and analysis.
• Flexible module combinations — configurable up to 5 slots to match test requirements.
• Targeted for mixed‑signal and analog IC characterization throughout the product lifecycle.

Product Presentation / Highlights

• Modular mainframe architecture (up to 5 slots) for scalable instrument integration.
• High hardware integration delivering extensive resources in a minimal enclosure.
• Kronos software translates test descriptions into optimized executable test code.
• Graphical interface tailored for designers and test engineers; limited programming required.
• Suitable for lab validation, R&D, pre‑production and final packaged test stages.

Included instrument capabilities (per slot and system)

• DC Sources (DCS): HP, MP and LP channel families covering different power ranges.
• Digital I/O: high‑density digital channels with pattern memory and DSIO support.
• Time measurement, differential metering, AWG and digitizer resources for precise timing and analog capture.
• Picoammeter functionality for low‑current measurement with high resolution and accuracy.

Technical specifications

• Model (commercial name): DMT EVO
• System architecture: Modular mainframe, up to 5 slots (configurable)
• Dimensions (D × W × H): 500 mm × 350 mm × 230 mm
• DCS HP: 8 channels, ±80 V / ±10 A (floating)
• DCS MP: 40 channels, -80 V / +110 V @ ±4 A
• DCS LP: 80 channels, -80 V / +110 V @ ±200 mA
• Digital channels: Up to 256 digital channels per slot (200/400 MHz)
• Digital PPMU: 256 PPMU per board
• Digital I/O electrical range: −1.25 V to 6.75 V; 50 mA drive; active load ±12 mA
• Pattern memory / DSIO: 64 M pattern memory and 32 M DSIO (per relevant resource)
• AWG / Digitizer / TMS / Differential Meter: 8 channels 400 MSPS AWG; 8 channels 80 MSPS digitizer (TMS); 8 differential meters
• AWG & digitizer density: up to 16 AWG/digitizer per slot (system dependent)
• Time‑measurement & differential metering: supports up to 32 mux4 expansion
• Picoammeter: current range 2 nA to 2 µA (up to ±20 pA accuracy)
• Software: Graphical user interface; Kronos automatic test program generator included
• Typical use cases: IC characterization, mixed‑signal test development, R&D, lab and pre‑production testing