Linear displacement sensor SI-F series

non-contactlaserdigital output

Micro-Head Spectral-Interference Laser Displacement Meter [Best in its Class] Resolution: 1nm (0.00004 mil) [World's Smallest] Micro Head Size: ø2 mm (ø0.08") [First in the Industry] Measurement principle: Spectral interference method Introducing the world’s first micro-head, with the highest measurement accuracy in its class and a level of performance that was previously thought impossible. These micro-head sensors can be used to measure the thickness and warpage of high-precision objects such as silicon wafers. Ultra High Resolution 1nm Spectral Interference Method that enables 1 nm Resolution. Head Variations That Expand the Range of Possible Measurements The lineup includes ultra-small, long-range, and other specialized heads to match a variety of applications. Eliminates the Causes of Measurement Errors The measurement head consists of only optical fibers and lenses, with no electronic parts.