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Diameter measuring system NEXIV VMZ-NWL200
positioncritical dimensiondimensional

Diameter measuring system - NEXIV VMZ-NWL200 - Nikon Metrology - position / critical dimension / dimensional
Diameter measuring system - NEXIV VMZ-NWL200 - Nikon Metrology - position / critical dimension / dimensional
Diameter measuring system - NEXIV VMZ-NWL200 - Nikon Metrology - position / critical dimension / dimensional - image - 2
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Characteristics

Measured physical value
diameter, position, dimensional, critical dimension
Technology
optical, vision, camera-based, video
Operating mode
automatic
Measured material
for wafers, for semiconductors
Applications
for industrial applications, for electronics, for production lines, for quality control
Other characteristics
high-precision, high-speed

Description

Overview
VMZ-NWL200 is an automatic wafer measuring system that integrates the NEXIV video measuring system with the NWL200 wafer loader. Using advanced image processing, it performs automatic high-speed, high-precision measurements of 6-inch and 8-inch wafers held in carriers, and provides measurement data suitable for semiconductor process control.

Reliability, efficiency and operability
  • High reliability: Fully automatic, repeatable measurements reduce operator variation. Nikon optical technology produces clear images for accurate edge detection.
  • High efficiency: Inspection can be started with one click. Measurement throughput is significantly higher than conventional measuring microscopes, reducing cost of ownership.
  • High operability: GUI displays wafer graphics so operators can select chips by clicking; dedicated software simplifies process-control workflows and accelerates feedback to production lines.

Product highlights
  • Integrated measuring cell combining NEXIV video measuring system and NWL200 automatic wafer loader.
  • Automatic and safe inspection of 6-inch and 8-inch wafers loaded in carriers.
  • High-speed, high-precision measurement designed for semiconductor process control and Quality 4.0 data requirements.

Core features
  • Automatic wafer handling and measurement for 6" and 8" wafers in carriers, including transfer and positioning functions.
  • Robust inspection programs with creation, execution and storage capabilities and full traceability.
  • Supports yield improvement by delivering rapid, high-quality measurement data to production control systems.
  • GUI-driven chip selection and measurement setup to simplify operator tasks.

Technical specifications
  • Device: Video Measuring System – NEXIV (VMZ-S3020 Type2 / Type3 / TypeTZ); Loader – NWL200
  • Wafer size: 6 inch, 8 inch (SEMI/JEIDA standard)
  • Compatible carriers: 6" – PA182-60MB-06XX (Entegris); 8" – PA192-80M-06XX (Entegris)
  • Throughput (transfer reference): 6 min 45 sec for 25 wafers (excluding measurement time)
  • Minimum L/S: 500 line/mm
  • Operating temperature: 19–26 °C
  • Operating humidity: less than 70% RH
  • Dimensions (W x D): 4125 x 3040 mm
  • Power supply voltage: AC 100–120 V / 200–240 V
  • Power frequency: 50 Hz / 60 Hz
  • Current consumption: 7.5 A / 3.7 A
  • Vacuum: -80 kPa

Notes
  • *1 Wafer transfer evaluation required before sale.
  • *2 Transfer time indicated is for 25 wafers and excludes measurement time.
*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.