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X-ray inspection machine / computed tomography / measurement
XT H 225

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Characteristics

  • Technology:

    X-ray, computed tomography

  • Other characteristics:

    measurement

Description

The entry-level XT H 160 and the versatile XT H 225 systems offer a microfocus X-ray source, a large inspection volume, high image resolution and is ready for ultrafast CT reconstruction. They cover a wide range of applications, including the inspection of plastic parts, small castings and complex mechanisms as well as researching materials and natural specimens.

Benefits
Proprietary 225 kV microfocus X-ray source with 3 µm focal spot size
Easy system operation and low cost-of-ownership
Stunning images providing great insight
High performance image acquisition and volume processing
Straightforward inspection automation
Safety first