Atomic force microscope NX-Mask
for photomask repairnanoscopeautomatic

atomic force microscope
atomic force microscope
atomic force microscope
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Characteristics

Type
atomic force
Technical applications
for photomask repair
Observation technique
nanoscope
Other characteristics
automatic, under ultra-high vacuum

Description

Park NX-Mask is the most effective, safe and efficient Photomask Repair System for High-end EUV Mask Repairs. It provides an all-in-one solution - from automatic defect review to repair and verification - accelerating throughput with unprecedented repair efficacy. Key Features ✔No risk of damage and seamless repair of any type of defects ✔Compatible with a dual pod for handling EUV masks ✔All-in-one solution for locating defects and post-repair verification

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