Atomic force microscope NX-Mask
for photomask repairnanoscopeautomatic

Atomic force microscope - NX-Mask - Park Systems - for photomask repair / nanoscope / automatic
Atomic force microscope - NX-Mask - Park Systems - for photomask repair / nanoscope / automatic
Atomic force microscope - NX-Mask - Park Systems - for photomask repair / nanoscope / automatic - image - 2
Add to favorites
Compare this product

Characteristics

Type
atomic force
Technical applications
for photomask repair
Observation technique
nanoscope
Other characteristics
automatic, under ultra-high vacuum

Description

Park NX-Mask is the most effective, safe and efficient Photomask Repair System for High-end EUV Mask Repairs. It provides an all-in-one solution - from automatic defect review to repair and verification - accelerating throughput with unprecedented repair efficacy. Key Features ✔No risk of damage and seamless repair of any type of defects ✔Compatible with a dual pod for handling EUV masks ✔All-in-one solution for locating defects and post-repair verification

VIDEO

Catalogs

No catalogs are available for this product.

See all of Park Systems‘s catalogs

Exhibitions

Meet this supplier at the following exhibition(s):

ELECTRONICA 2026
ELECTRONICA 2026

10-13 Nov 2026 Munich (Germany) Hall C1 - Stand 501

  • More information
    *Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.
    About DirectIndustry
    DirectIndustry is a marketplace that offers B2B players a complete experience, from product sourcing to purchase. DirectIndustry is an entity of VirtualExpo Group.