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analysis microscope / for research / high-speed / scanning acoustic
SAM 400 TWIN

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analysis microscope / for research / high-speed / scanning acoustic analysis microscope / for research / high-speed / scanning acoustic - SAM 400 TWIN
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Characteristics

  • Technical applications:

    for analysis, for research

  • Other characteristics:

    high-speed, scanning acoustic, for semiconductors

Description

The SAM 400 TWIN is a high performance tool enabling non destructive acoustic investigations for high throughput analysis, quality control and research applications. It features a new high speed linear motion scanner and new rf and transducer technologies of up to 400 MHz, controlled through a user friendly graphical interface.

A new master/slave concept enables arrays of two transducers to acquire simultaneous acoustic images.

Built to semiconductor industry standards around a core platform that utilizes the latest production and research technology, the SAM TWIN SCAN can accurately handle wafers up to 400 mm. Ultrasound frequency range up to 500 MHz with transducer from 3 MHz - 400 MHz.

Scanning range: x=250 µm-430 mm, y=250 µm-430 mm, z=100mm
Auto focus is applied to each transducer