Memory test system SC-588-CD-F

heat cyclefunctional safetyaging

SANWOOD eMMC Memory Burn-in Test System

The SANWOOD eMMC Memory Burn-in Test System combines controlled chamber temperatures with programmable read, write and erase sequences. It keeps eMMC devices active during thermal stress and tests multiple devices in parallel for production screening, endurance testing and data retention evaluation.

Key Features

Parallel testing of eMMC devices on high-density test boards

Independently programmable VCC and VCCQ supplies for voltage margin testing at each slot

Configurable read, write and erase patterns to exercise the embedded flash controller during burn-in

Slot-level monitoring to help identify failing devices during parallel testing

Models and Specifications

Chamber temperature control range — −70°C to +150°C

SC-588-CD-F — 588 L single chamber

SC-588-CD-F internal dimensions (W × H × D) — 800 × 1,050 × 700 mm

SC-588-CD-F external dimensions (W × H × D) — 1,890 × 1,925 × 1,520 mm

LS407H — Dual-chamber configuration

LS407H external dimensions (W × H × D) — 4,000 × 2,120 × 1,520 mm

Customization

Chamber interior dimensions and test rack configurations can be customized to match your test board dimensions, required board spacing and target slot count.

Applications and Test References

Designed for embedded storage used in automotive electronics, industrial controllers, networking equipment and IoT devices. Test plans can reference JEDEC JESD84-B51 for the eMMC 5.1 interface and, where applicable, JESD22-A117 or AEC-Q100-005 for endurance and data retention evaluation.

For a configuration proposal, share your eMMC package type, test board drawings, target slot count and temperature profile.

Product page — https://www.sanwood.us/products/190.html

Email — info@sanwood.com