Memory test system SM-ZOV665-W5K

heat cyclefunctional safetyaging

SANWOOD Single-Door Dynamic IC Burn-in and HTOL Test System

The SANWOOD SM-ZOV665-W5K combines a temperature-controlled chamber with programmable electrical test patterns for dynamic burn-in and high-temperature operating life (HTOL) testing. It exercises powered ICs on burn-in boards (BIBs) at elevated temperatures, allowing engineers to monitor device behavior during thermal and electrical stress.

Key Features

Programmable test vectors for exercising IC logic and memory during burn-in

Slot-level power isolation and programmable current limits

Per-slot voltage, current and temperature logging for failure analysis

Technical Specifications

Model — SM-ZOV665-W5K, single-door configuration

Chamber temperature range — Ambient +10°C to +150°C

Burn-in board capacity — 16 slots

Burn-in board size — 450 × 570 mm

Signal channels — 184 total, with 160 common driver channels and 24 I/O channels

Maximum system repetition rate — 20 MHz

Vector memory — 64M words

Error log capacity — 2K per I/O

Device power supply — 8 channels per BIB in the default configuration

Internal dimensions (W × H × D) — 800 × 1,320 × 630 mm

External dimensions (W × H × D) — 1,920 × 2,287 × 1,600 mm

Customization

Chamber interior dimensions and test rack configurations can be customized to accommodate your BIB dimensions, board spacing and loading requirements.

Applications and Test References

Suitable for burn-in screening and operating-life evaluation of automotive SoCs, microcontrollers, AI accelerators, memory ICs and power management ICs. Depending on the device and test plan, relevant references include JEDEC JESD22-A108 for HTOL, AEC-Q100 Test B1 for automotive IC HTOL, and MIL-STD-883 Method 1015 for microcircuit burn-in.

For a configuration proposal, share your device type, BIB drawings, electrical load and required test profile.

Product page — https://www.sanwood.us/products/189.html

Email — info@sanwood.com