Interferometry sensor NS-1

This is a new optical interferometry system that is not limited by the accuracy of the optical elements or the object being measured, based on the fact that the statistics of the scattering field (laser speckle) generated when a rough surface object is irradiated by a laser is completely random in a statistical sense. Expected Applications • Operation analysis of micro mechanical components such as MEMS • Applications where strain gages are not applicable (measurement of deformation and thermal strain characteristics of polymer materials and micro-jointed parts) • Biological samples (measurement of ultra-short time behavior of plant growth, high-precision growth monitoring of crops in plant factories, setting of optimal cultivation conditions) • Environmental measurement (environmental assessment using living organisms) Features • High precision measurement – Sub-nanometer order measurement is possible (The measurement system is simply determined by the number of data points used.) • Non-contact, non-invasive measurement • Simple optical system • No absolute reference point required for measurement (any two points can be used) Laser - Wavelength: 660nm Maximum output: 90mW Class 3B equivalent Laser beam diameter - Approx. 1.0mm Laser beam interval - Approx. 3.0mm Measurement accuracy - ±1.0nm PC & software - Provided as standard accessories Frame rate - 2fps Power supply - Single-phase, AC100V, 50/60Hz, 5A Dimensions - • W240 × D200 × H280mm (Main unit) • W390 × D320 × H200mm (Control unit) Weight (approx.) - • 5kg (Main unit) • 6kg (Control unit)