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... The new product, "Xtrology," Fully Automated Thin Film Inspection System*1 has made it possible to perform important inspections, such as film thickness measurement, defect analysis, ...
... The eSL10™ electron-beam (e-beam) patterned wafer defect inspection system leverages the industry’s highest landing energy and high resolution to capture small physical and high aspect ratio defects, supporting process ...
KLA Corporation
... Product Flow: Conveyor Max Camera Field of View: 110 x 110 mm Label Quality Inspection: Graphical ID, Label Placement, Label Skew, Label Wrinkles Inspection Application: Code Inspection, ...
... technologies, reducing time, cost and downtime. Inspection Application Code Inspection Contamination Detection Label Inspection Weight Control Specifications Reading Devices: ...
... real 100 % control of the entire image of every single folding carton. Zero chance for faulty cartons. • Quality control for high-grade embellishments • Up to four cameras from above, one back ...
... results. Advantages of manual and semi- automatic systems For companies that produce quantities of medium-large workpieces, TemaFlux manual and semi- automatic systems are the ideal ...
... A1040 MIRA 3D for ultimate inspection range extension E-Boosting is a novel feature of the ultrasonic tomograph series A1040 MIRA 3D that allows multiple inspection range extension by means of intelligent transmitter ...