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... analysis algorithms, equipped with double telecentric optical lens with high depth of field, VX3000 series of Flash Measuring Machines achieve fast dimensional measurement by one-key operation. VX3000 series are suitable ...
Chotest Technology Inc.
... analysis algorithms, equipped with double telecentric optical lens with high depth of field, VX3000 series of Flash Measuring Machines achieve fast dimensional measurement by one-key operation. VX3000 series are suitable ...
Chotest Technology Inc.
... analysis algorithms, equipped with double telecentric optical lens with high depth of field, VX3000 series of Flash Measuring Machines achieve fast dimensional measurement by one-key operation. VX3000 series are suitable ...
Chotest Technology Inc.
... analysis algorithms, equipped with double telecentric optical lens with high depth of field, VX3000 series of Flash Measuring Machines achieve fast dimensional measurement by one-key operation. VX3000 series are suitable ...
Chotest Technology Inc.
VX1100 is suitable for precise dimensional measurement in the fields of machinery, electronics, molds, injection molding, hardware, rubber, low-voltage electrical appliances, magnetic materials, precision stamping, connectors, connectors, terminals, mobile ...
Chotest Technology Inc.
... Item No.: VX4230S Product name: Flash Measuring Machine Image Senor: 12M CMOS Field of view：φ230mm Depth of Field: 50mm Working Distance: 400mm Accuracy: ±5μm(Without Stitching) Resolution: 0.1μm Loading Capacity: ...
Chotest Technology Inc.
... The CHOTEST Novator333 automates video measuring (AVMM) for superior precision and speed. Its high-resolution camera and double telecentric optics deliver submicron accuracy, while the motorized stage ensures swift measurement ...
Chotest Technology Inc.
... Microscopic measuring machine MX3200 achieves wide-range measurement of tiny features by combining microscopic imaging with traditional video measurement. Equipped with a motorized turret, it can measure various microscopic ...
Chotest Technology Inc.
... Patterned Wafer Critical Dimension & Overlay Measurement System is an optical inspection instrument that can perform both high-precision XY plane dimension inspection and sub-nanometer surface 3D topography ...
Chotest Technology Inc.