KLA 3D profilometers
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... and SECS/GEM Applications • Step height: 2 D and 3D step height • Texture: 2 D and 3D roughness and waviness • Form: 2 D and 3D bow and shape • Stress: ...
KLA Corporation
... and SECS/GEM Applications • Step height: 2 D and 3D step height • Texture: 2 D and 3D roughness and waviness • Form: 2 D and 3D bow and shape • Stress: ...
KLA Corporation
... through 200mm opaque (e.g., silicon) and transparent (e.g., sapphire) samples Applications • Step height: 2 D and 3D step height • Texture: 2 D and 3D roughness and waviness ...
KLA Corporation
... semiconductor, compound semiconductor, high brightness LED, data storage and related industries. The P-260 configuration supports 2 D and 3D measurements of step heights, roughness, bow, and stress for scans up to 200mm ...
KLA Corporation
... high-resolution 3D data and a True Color infinite focus image. The Zeta-388 supports both R& D and production environments with Multi-Mode optics, easy-to-use software, a low cost of ownership, and SECS/GEM communications. The ...
KLA Corporation
... • Software: User friendly software interface Applications • Step Height: 2 D and 3D step height • Texture: 2 D and 3D roughness and waviness • Form: 2 D bow and shape • ...
KLA Corporation
... benchtop stylus profiler Software: User friendly software interface Graph showing step height measurements Applications Step Height: 2 D step height Texture: 2 D roughness and waviness ...
KLA Corporation
... applications Applications Step height: 3D step height from nanometers to millimeters Texture: 3D roughness and waviness on smooth to very rough surfaces Form: 3D bow and shape Stress: ...
KLA Corporation
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