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The Firefly inspection series provides an automated inspection solution for high performance applications like FPGA, CPU/GPU and networking servers in addition to applications with low I/O counts: IC ...
Onto Innovation Inc.
... processing and a machine-learning algorithm to detect low contrast defects in the active pixel sensor area. The Dragonfly G3 system is tightly integrated with control and analytical software for real-time analysis ...
Onto Innovation Inc.
... at run time to reduce manual operator review. The system is designed as a multipurpose inspection and sorting system for end of line outgoing quality inspection of 300mm unpatterned ...
Onto Innovation Inc.
Designed to blur the lines between dark field micro inspection and traditional macro inspection, the F30 System provides automated defect inspection for front-end and outgoing quality ...
Onto Innovation Inc.
... using Discover Review software. Applications Edge Inspection • Lithography process monitoring • Cracks/Chips • Residue • EBR Concentricity • Bonding adhesive inspection Backside Inspection • ...
Onto Innovation Inc.
... • Bow and warp Specifications • Choice of inspection platforms with hard-anodized finish which can accommodate 100mm to 330mm whole wafers • The objective turret provides flexibility for inspection ...
Onto Innovation Inc.
Width inspection range: 150, 200, 300 mm
... production and quality assurance. The AWX inspection tool can handle 150mm, 200mm and 300mm wafers enabling automatic wafer sorting based on inspection results. Specifications • 150/200/300mm automated ...
Onto Innovation Inc.
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