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... Resolution interface: 0.1 K
Resolution display: 1 K
Optical variants
Lenses and focus (examples):
Measuring range 500 - 1400 °C: Objective F50 PZ 20.08 focusing 0.3 m - ∞;
Measuring ...
Keller Pyrometer Systems
... Measurement /
optical data (summary):
Measuring range: 500 - 3000 °C (in several segments)
Spectral range: 0.95 / 1.05 µm
Measuring principle: two-colour
Sensor: Double photo diode
Distance ...
Keller Pyrometer Systems
... b>Product overview
Two-colour (ratio) pyrometer
measuring
system for non-contact temperature measurement in industrial processes. Model: CellaTemp PX 40-K001. Available in several
measuring-range ...
Keller Pyrometer Systems
...
Features:
Through-the-lens sighting; Laser pilot light;
Camera (option);
Display — 4-digit red LED display, digit-height 8 mm; Status
display — 2 x LED;
Control elements ...
Keller Pyrometer Systems
... Measurement parameters:
Measuring range: 500 - 3000 °C in several segments
Sensor: Double photo diode
Spectral range: 0.95 / 1.05 µm
Response time t98:
Measuring range 500 - 1400 °C: ≤ 10 ms (T > 650 °C); ...
Keller Pyrometer Systems
... Measuring system consisting of:
- Pyrometer CellaTemp PX 29 AF 21
- Mounting PA 20-122
Overview / Short info
The product is a measuring system ...
Keller Pyrometer Systems
... CellaTemp PX 69-K001
Keller Pyrometer Systems
... Combination measuring device for measuring the ovality, eccentricity, concentricity and diameter of cables Properties Simultaneous same-point optical and magnetic measurement Cross-section measurement ...
... department Networking capability with a higher level system Benefits • Increased sampling rate of up to 2 kHz • Maximum measuring accuracy thanks to temperature-stabilized measuring systems ...
... developed a series of shaft copying systems based on special belts. All necessary installation parts are included for quick and easy mounting in the shaft. The systems can be delivered as a circumferential or guided ...
... Correlation System Q-400 is an optical measuring device for true full-field, non-contact and three-dimensional measurement of shape, displacements and strains on components and structures made from almost ...
... specified for excellent flatness less than 100 microns, there are available in the market optical Z axis inspection system utilizing an XY table. These systems come with a hefty list price (pushing $30K) ...