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Atomic force microscope NaioAFMmeasuringsurface roughnesseducational
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Characteristics
- Type
- atomic force
- Technical applications
- measuring, surface roughness, educational, for surface inspection
- Configuration
- compact, benchtop, portable
- Other characteristics
- digital camera, high-resolution, simple installation
- Resolution
Min.: 14 µm
Max.: 70 µm
Description
The leading AFM for nanoeducation
Compact and robust
Easy to use
Real value for money
The NaioAFM is the ideal atomic force microscope for nanoeducation and basic research on small samples. This all-in-one AFM system provides solid performance and easy handling, with a price tag and footprint that fit anyone and any place.
VIDEO
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Nanosurf NaioAFM
4 Pages
Isostage 300
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*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.