Atomic force microscope NaniteAFM
for analysissurface roughness3-axis measuring

atomic force microscope
atomic force microscope
atomic force microscope
atomic force microscope
atomic force microscope
atomic force microscope
atomic force microscope
Add to favorites
Compare this product
 

Characteristics

Type
atomic force
Technical applications
for analysis, surface roughness, 3-axis measuring, for surface inspection, steel inspection, for materials inspection, measuring, inspection, industrial, metrology, for production lines, for in-line wafer inspection
Configuration
compact
Other characteristics
automated, high-resolution, sliding-stage, for polished samples, for wafers, high-precision, for big samples, topography
Resolution

Max.: 110 µm

Min.: 5 µm

Description

The smallest AFM for custom integration Compact Robust Easy to integrate The surface morphology is an important property for many high-tech surfaces with features that can go down to a few nanometers and surface roughness below the nanometer. With AFM such features can be readily analyzed under ambient conditions. Most AFMs are limited in the type and size of samples they can handle. The NaniteAFM by Nanosurf is the market leading solution for AFM integration with least restriction to the sample dimensions. The NaniteAFM has a tip-scanner, two inspection video cameras and an on-board approach motor in an exceptionally small footprint. It contains everything needed to operate independently, paving the way for easy integration: All you need is 300 cm3 in space and a stable docking site to mount the AFM.

VIDEO

*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.