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analysis microscope / surface roughness / 3-axis measuring / for surface inspection
NaniteAFM

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analysis microscope / surface roughness / 3-axis measuring / for surface inspection analysis microscope / surface roughness / 3-axis measuring / for surface inspection - NaniteAFM
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Characteristics

  • Technical applications:

    for analysis, surface roughness, 3-axis measuring, for surface inspection, steel inspection, for materials inspection, measuring, inspection, industrial, metrology, for production lines

  • Type:

    atomic force

  • Ergonomics:

    compact

  • Other characteristics:

    automated, high-resolution, sliding-stage, for in-line wafer inspection, for polished samples, for wafers, high-precision, for big samples, topography

  • Resolution:

    Min.: 5 µm

    Max.: 110 µm

Description

The smallest AFM for custom integration
Compact
Robust
Easy to integrate
The surface morphology is an important property for many high-tech surfaces with features that can go down to a few nanometers and surface roughness below the nanometer. With AFM such features can be readily analyzed under ambient conditions. Most AFMs are limited in the type and size of samples they can handle. The NaniteAFM by Nanosurf is the market leading solution for AFM integration with least restriction to the sample dimensions.

The NaniteAFM has a tip-scanner, two inspection video cameras and an on-board approach motor in an exceptionally small footprint. It contains everything needed to operate independently, paving the way for easy integration: All you need is 300 cm3 in space and a stable docking site to mount the AFM.