SEM sample preparation systems

... TEM, etc. by extracting a micro sample with an ion beam in the vacuum chamber of an FIB system. FIB micro-sampling unit and FIB micro-sampling method An example of FIB micro-piller ...

... poised to perform in your lab for years to come. The MC1000 Ion Sputter Coater is a sample preparation instrument for use with a Scanning Electron Microscope (SEM). ...

... specimen surface and the irradiated electron beam generate sample contamination. Hydrocarbons are generally non-covalently attached to the specimen surface during sample handling, preparation, ...

... specimens depending on the purpose. Cooling Temperature Control, Air Protection Holder Unit, and Various options enable preparation of various cross section specimens. High Milling Rate The cross section milling rate*1 ...

The most advanced broad ion beam system for producing exceptionally high-quality cross-section or flat-milling samples for electron microscopy. The ArBlade 5000 is equipped with a fast-milling Ar ion ...

... possible data from your TEM samples. Sample surfaces are inevitably contaminated with hydrocarbon due to sample preparation or storage. The ZONETEM II desktop sample ...

... formation of artefacts. Prepare your samples for detailed image evaluation under optimal conditions: • - Cold shield around the sample avoids water molecules freezing onto your sample • ...

... concept • - Monitor your sample with respect to temperature and vacuum at any time during the workflow when docked Why Vacuum Cryo Transfer? During the transfer of samples ...

The Leica EM TXP is a target preparation device for milling, sawing, grinding, and polishing samples prior to examination by SEM, TEM, and LM techniques. An integrated stereomicroscope ...

... performed by one stage. Workflow solutions provide safe and efficient transfer of samples to subsequent preparation instruments or analysis systems. Flexible system ...

... EM TRIM2 is a high speed milling system with integrated stereomicroscope and LED ring illuminator for trimming of biological and industrial samples prior to ultramicrotomy. The Leica TRIM2 features ...

... hundreds of serial-section ribbons all ready for array tomography with your scanning electron microscope (SEM). Save time and effort in biological sample preparation ...

... Cryoultramicrotome within minutes by mounting the Cryochamber Leica EM FC7 and prepare your cryo-sections ( -15° to -185°C) for TEM, SEM, AFM and LM. You are just four steps away from perfect cryo-sections Key Features Great ...

Producing homogenous and conductive metal or carbon coatings for SEM and TEM analysis was never before more convenient than with the Leica EM ACE200 coating system. Configured as a sputter coater or ...

... versatile high vacuum film deposition instrument for your FE-SEM and TEM applications. Whether you need to • - enhance contrast by a fine-grained metal layer, • - produce nanometer thin but robust ...