SEM sample preparation systems

... formation of artefacts. Prepare your samples for detailed image evaluation under optimal conditions: • - Cold shield around the sample avoids water molecules freezing onto your sample • - Accurate temperature ...

... concept • - Monitor your sample with respect to temperature and vacuum at any time during the workflow when docked Why Vacuum Cryo Transfer? During the transfer of samples between ...

... The Leica EM TXP is a target preparation device for milling, sawing, grinding, and polishing samples prior to examination by SEM, TEM, and LM techniques. An integrated stereomicroscope allows pinpointing ...

... performed by one stage. Workflow solutions provide safe and efficient transfer of samples to subsequent preparation instruments or analysis systems. Flexible system – Adaptable ...

... EM TRIM2 is a high speed milling system with integrated stereomicroscope and LED ring illuminator for trimming of biological and industrial samples prior to ultramicrotomy. The Leica TRIM2 features a 1µm feed control ...

... UC Enuity Ultramicrotome Do you need to produce thin or ultra-thin sections for EM sample preparation? Introducing UC Enuity, the next generation ultramicrotome that saves you valuable time and resources through its ...

... Cryoultramicrotome within minutes by mounting the Cryochamber Leica EM FC7 and prepare your cryo-sections ( -15° to -185°C) for TEM, SEM, AFM and LM. You are just four steps away from perfect cryo-sections Key Features Great ...

... Producing homogenous and conductive metal or carbon coatings for SEM and TEM analysis was never before more convenient than with the Leica EM ACE200 coating system. Configured as a sputter coater or carbon thread evaporation ...

... versatile high vacuum film deposition instrument for your FE- SEM and TEM applications. Whether you need to • - enhance contrast by a fine-grained metal layer, • - produce nanometer thin but robust carbon films, ...

... observation objects and sample holders themselves are the dominant source of contamination. Here, plasma treatment often proves to be too rough in the sense of altering or even destroying the sample. Hitachi’s ZONE cleaners ...

... IM4000 II is a modular computer-controlled argon ion polishing system that can be equipped as a pure surface polisher, as a cross-section polisher or as a hybrid system, depending on the desired functionality. With a ...

... The IM series systems are indispensable for SEM sample preparation. They are ideal for when high-quality, millimetre-scale cross-sections or surfaces are needed and conventional mechanical ...

... observation objects and sample holders themselves are the dominant source of contamination. Here, plasma treatment often proves to be too rough in the sense of altering or even destroying the sample. Hitachi’s ZONE cleaners ...