SEM sample preparation systems

... formation of artefacts. Prepare your samples for detailed image evaluation under optimal conditions: • - Cold shield around the sample avoids water molecules freezing onto your sample • - Accurate temperature ...

... concept • - Monitor your sample with respect to temperature and vacuum at any time during the workflow when docked Why Vacuum Cryo Transfer? During the transfer of samples between ...

... VCT500, Cryo CLEM and Cryo TEM systems. Double Cryo Micromanipulator for cryogenic sectioning of Tokuyasu and CEMOVIS specimen samples is compatible with UC Enuity Cryo Chamber. With UC Enuity’s precise temperature control ...

... The Leica EM TXP is a target preparation device for milling, sawing, grinding, and polishing samples prior to examination by SEM, TEM, and LM techniques. An integrated stereomicroscope allows pinpointing ...

... performed by one stage. Workflow solutions provide safe and efficient transfer of samples to subsequent preparation instruments or analysis systems. Flexible system – Adaptable ...

... EM TRIM2 is a high speed milling system with integrated stereomicroscope and LED ring illuminator for trimming of biological and industrial samples prior to ultramicrotomy. The Leica TRIM2 features a 1µm feed control ...

... Cryoultramicrotome within minutes by mounting the Cryochamber Leica EM FC7 and prepare your cryo-sections ( -15° to -185°C) for TEM, SEM, AFM and LM. You are just four steps away from perfect cryo-sections Key Features Great ...

... Producing homogenous and conductive metal or carbon coatings for SEM and TEM analysis was never before more convenient than with the Leica EM ACE200 coating system. Configured as a sputter coater or carbon thread evaporation ...

... versatile high vacuum film deposition instrument for your FE- SEM and TEM applications. Whether you need to • - enhance contrast by a fine-grained metal layer, • - produce nanometer thin but robust carbon films, ...

... function: clean and store samples in one device

... Advanced ion milling for fast, high-quality SEM sample preparation.

• High milling rate: Fast and efficient sample preparation for hard materials
• Cross-section

... IM5000 ion milling systems deliver precision sample preparation for scanning electron microscopy ( SEM) and related surface-analysis techniques. Suitable for metals, semiconductors, ...

... function: clean and store samples in one device