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Magnification: 10 unit - 250,000 unit
... sample stage is done using an automatically generated, zoomable colour photo overview. This can be supplemented locally by SEM photo snapshots. Product features: - EDX with 30mm2 or 60mm2 sensor size can be fully integrated, immediate ...
... documentation of the surface of a component to reveal irregularities. Scanning Electron Microscope | SEM | Microhone | CNC Tooling A Scanning Electron Microscope (SEM) is used to give an accurate ...
Resolution: 0.02 µm
... Product overview
The Atomic Force
Microscope (wafer-level AFM) is a high-resolution scanning probe instrument designed to characterize three-dimensional surface morphology and multifunctional properties of conductors, semiconductors ...
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