OverviewIon Beam Figuring (IBF) is a vacuum corrective polishing process using accelerated argon atoms to ablate material and correct surface errors down to a few nanometers with sub-millimeter local resolution. It is designed for final finishing of precision optical surfaces and complex geometries.
Key benefits- Capable of polishing almost any shape: 6-axis direct drive keeps the ion source orthogonal to the workpiece, enabling machining up to and beyond surface edges.
- Surface qualities of λ/200 and better: Corrects very small surface errors to reach high optical surface quality suitable for final processing.
- Fully automated with high reproducibility: Iterative, fully automated workflow supports multiple apertures without intermediate workpiece measurement for predictable lead times.
Highlight features- Advanced software — easy setup and simulation: User-friendly software analyses and visualizes measured data from multiple sources and prepares machining simulations; GUI is customizable for specific applications.
- ISERM — in-situ etch-rate measurement: Low-coherence measurement system determines the etch-rate profile of the ion source with high precision; interchangeable sample holder supports a wide range of materials and multiple measurements with a single head.
- Aperture changer — up to five diaphragms: Apertures can be changed during operation inside the vacuum chamber; supports up to five diaphragms with diameters from 0.5 mm to 20 mm.
Downloads- Brochure for precision optics (PDF)
- IBF series technical data (PDF)
Technical specifications- Process type: Ion Beam Figuring (IBF) corrective polishing under vacuum
- Working species: Accelerated argon atoms
- Typical precision: down to a few nanometers
- Local resolution: sub-millimeter range
- Mechanics: 6-axis direct drive to maintain ion source orthogonality
- Edge capability: machining up to the surface edge and beyond
- Surface quality capability: λ/200 and better
- Automation: fully automated iterative workflow, high reproducibility
- Aperture changer: up to five diaphragms changeable in vacuum
- Aperture diameter range: 0.5 mm – 20 mm
- Etch-rate measurement: ISERM low-coherence in-situ measurement system
- Measuring hardware: interchangeable sample holder; multiple measurements with a single head
- Software: analysis and visualization of measured data, simulation preparation, customizable GUI