Roughness measuring system Waveline W900 series

contourbearingbearing

The Waveline W900 series was developed for measuring tasks in high-performance areas, e.g. in the environment of automated process chains. The systems have two interfaces for coupling the touch probes and optionally additional axes for automating measuring sequences. The arrangement of the touch probes and the innovative traverse concept ensure optimum access to the measuring points. System features • Fast measurement technology • Highly flexible, dynamic measurement • Excellent measuring accuracy in combination with Nanoscan probe system • Extensive options for automated, CNC-controlled measurement runs • Dual operation of two probe systems; a roughness probe system can also be installed on the front of the traverse unit; also suitable for optional rotary module • Optional motorized tilt unit for precise adjustment of the tilt angle and automatic alignment of the probe to the workpiece level • Measuring Z column with linear scale at a resolution of 0.1 μm for measurement of vertical distances outside the Z measuring range of the probe; requires probe arm with double probe tip • Additional motorized Y axis or X-Y axis combination for automatic zenith search, topography measurement and workpiece positioning • Optional rotational axis for roughness measurement on cylindrical workpieces in circumferential and axial direction Benefits • Minimum measuring cycles • Maximum accuracy • Maximum flexibility • QCA Quick Change Adapter