Roughness measuring system Waveline W600

contour

Waveline W600 roughness and contour measurement systems are easy to operate and, with manual height adjustment, a wide range of mounting options and high measurement quality, are the ideal companion for measurements close to production. System features • Universal, easy-to-use measuring system • High measurement quality thanks to stable mechanics • Unique traverse concept for optimum accessibility of the measuring points • Modern touch probes with high resolution • Interface for probe systems for either roughness or contour measurement with TKU400 or Digiscan probe system • Quick-change adapter QCA enables quick probe system changeover with minimum retooling time due to automatic probe recognition • Sophisticated probe arm technology • Probe arms with magnetic coupling for fast and easy probe arm changeover • All contour probe arms with RFID chip for simplified calibration and automatic configuration • Measuring points freely accessible thanks to unique traverse unit concept • Later expansion of the measuring system possible