Stationary thickness gauge thicknessGAUGE C.C
glassfor thin materialsdry film

stationary thickness gauge
stationary thickness gauge
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Characteristics

Type
stationary
Applications
glass, for thin materials, dry film, film, foil, for sheet materials
Technology
non-contact, confocal chromatic, spectral reflectance
Calibration
automatic calibration
Other characteristics
high-resolution, in-line, contactless, with integrated probe
Measuring range

2 mm
(0.08 in)

Measurement accuracy

4 µm

Measurement width

Min.: 200 mm
(7.9 in)

Max.: 400 mm
(15.7 in)

Resolution

40 nm

Ambient temperature

Min.: 5 °C
(41 °F)

Max.: 45 °C
(113 °F)

Description

The thicknessGAUGE C.C sensor systems use confocal chromatic displacement sensors for the thickness measurement. The sensors allow for measurements to be performed with outstanding accuracy and high measuring rates. In addition, this innovative measuring technique enables measurements of reflective and shiny surfaces as well as (semi-)transparent measuring objects. The thicknessGAUGE sensor systems are used in strip processes and plate production in order to measure the thickness continuously at individual measuring points. These systems are designed in such a way that they can be used as both initial equipment and for retrofitting of existing facilities. Based on high precision and equipped with intelligent sensor technology, these sensor systems are used in various industries. Powerful analysis and control software: thicknessGAUGE systems are equipped with a multi-touch capable software package for analysis, presentation and archiving of monitored production data. This software enables different measurement modes such as fixed track thickness measurement at any position, measurement of the thickness profile, measurement of several longitudinal trends, an SPC package and automated verification of the measuring system's capability. It ensures easy and fast verification of the measuring system capability which is individually adjustable. Features for documentation and process control: Article database Production archive Statistical evaluations Limit value monitoring with return back to production (optional fieldbus interfaces) Verification of measuring system capability

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Exhibitions

Meet this supplier at the following exhibition(s):

Optatec

14-16 May 2024 Frankfurt am Main (Germany) Hall 8 - Stand C106

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    Elmia Automation

    14-17 May 2024 Jönköping (Sweden) Hall D06 - Stand 61

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    *Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.