Optical profiler TopMap Micro.View+

3Dinterferometricwhite light interferometry

Аналіз параметрів форми і шорсткості, текстури, виявлення подряпин і дефектів, мікроструктур, MEMS або напівпровідникових компонентів з субнанометровою роздільною здатністю? Micro.View+ - це профілометр поверхні з максимальною повторюваністю і точністю вимірювань. MODULAR OPTICAL PROFILER FOR ROUGHNESS AND MICROSTRUCTURES TopMap Micro.View+ is the next generation optical 3D profiler from Polytec. The modular system offers various configurations for becoming your custom surface test station- whether for texture, microstructures or roughness on precision-manufactured parts or microsystems. Micro.View+ is designed for the research lab and production level, while its modular design allows even head-only integration for in-line surface inspections. Display your 3D topography data and use the color mode for meaningful visualization and analysis, for detecting surface defects or documentation. The optional 5 MP camera records 3D measurement data thoroughly, delivering insights on surface texture and form and thus allowing feedback and optimization on your mechanical engineering or machining processes. MODULAR & AUTOMATED QUALITY INSPECTIONS INLINE & AT LINE The wide accessory set simplifies and accelerates your measurements. While Focus Finder and the innovative Focus Tracker always keep test specimens in focus under all circumstances and during repositioning, the fully motorized positioning stage supports stitching and automated inspections while adjusting tip/tilt automatically. + Top of the line white-light interferometer with sub-nm resolution + 100 mm vertical measuring range with CST Continuous Scanning Technology + Focus Finder and Focus Tracker ideal for automated production control + Motorized tip-tilt stage and turret for automatic positioning + Color mode for professional analysis and documentation of defects + Modular for application-specific configurations + NEW: Extended lens options 0.6X ... 111X now available