Optical profilometer TopMap Micro.View

3Dwhite light interferometryinterferometric

Compact Optical Profiler for Microstructures and Roughness TopMap Micro.View® is the compact measuring system of the TopMap family of whitelight interferometers enabling repeatable and high-resolution inspections and evaluations of surface structural detalis, surface texture and surface roughness parameters. With integrated CST Continuous Scanning Technology, the 100 mm travel in Z-axis offers a complete 100 mm measuring range with a vertical resolution in the range of nanometers. This optical profilometer is characterized by its compact design with integrated electronics and impresses with ease of use - for example, via automatic Focus Finder feature for fast and efficient measurements in production environments and test laboratories. + Full areal and 3D topography analysis of roughness and textures and microstructures + Compact profiler system for analyzing surface details + 100 mm large vertical measuring range with CST Continuous Scanning Technology + Excellent lateral resolution + Application specific objectives Contact us for demonstrations, feasibility studies on your specific samples and more information.