Optical profilometer TopMap Micro.View

3Dinterferometricwhite light interferometry

Compact optical profiler for microstructures & roughness
TopMap Micro.View® is an easy to use and compact optical profiler. Combine exceptional performance and affordability with this Coherence Scanning interferometer.

The extended 100 mm large Z measurement range with Continuous Scanning Technology (CST) measures microstructures and textures of
precision surfaces with sub-nm resolution. The convenient table-top setup features integrated electronics, with the advanced Focus Finder simplifying and speeding up the measurement procedure.

<< $$$ BONUS -30% on streamlined Rouhness Tester configuration >>

Benefit from the optional ECT Environmental Compensation Technology, enabling reliable and accurate measurement results even in noisy and challenging production environments. Add the custom TopMap 0.6x lens expanding your capabilties for high resolution form measurements. The advanced Focus Finder simplifies and speeds up measurement procedures. Micro.View® is the cost-effective quality control instrument for inspecting precision engineered surfaces, roughness and micro topography in the field of manufacturing and research.

+ Sub-nm resolution profiler with small footprint, measuring roughness, microstructures and finish reliably
+ Advanced Focus Finder for faster procedures
+ Full 100 mm Z measuring range with CST Continuous Scanning Technology
+ Excellent lateral resolution
+ Operator Interface for 1-click measurement recipies at production level
+ Application-specific objectives NEW: 0.6x .. 111x, manual turret
+ Positioning stage options XY 20/ 75/ 100 mm
+ 1click testing solutions available with automated workflows

Free feasibility study on your test samples // -30% discount on slim Roughness Tester configuration