Area scan camera NS-615A-GE

2Ddigitalindustrial

Description
The NS-615A-GE is an area-scan SWIR camera based on an InGaAs detector with built-in image correction and processing algorithms. It provides digital output via a GigE interface, a snapshot global shutter and low power consumption, making it suitable for semiconductor inspection, sorting and machine vision tasks requiring short-wave infrared imaging.

Key Features

• Low-noise digital output
• GigE interface for image transmission
• Built-in image correction and processing algorithms
• Low power consumption for easy integration

Specifications (table)
Technical parameters: NS-615A-GE

• Sensor: InGaAs
• Spectral response range: 0.9 μm – 1.7 μm
• Quantum efficiency: ≥70% (1.0–1.6 μm)
• Optical fill factor: 100%
• Pixel pitch: 15 μm
• Active pixels: 640 × 512
• Pixel operability: ≥99.8%
• Maximum frame rate (full array): 180 Hz
• Output data depth: 14 / 12 / 10 / 8 bit
• Exposure type: Snapshot global shutter
• Minimum integration time: 100 μs
• Dynamic range (typical): 67 dB (HG)
• Optional gain: 3
• Average pixel dark current: ≤100 ke-/s @ 20℃
• Power supply voltage: Typical 12 V
• Typical power consumption: <2.5 W (TEC off)
• Interface: GigE
• Lens mount: C-Mount
• Core weight: 150 ± 5 g
• Core dimensions: 46 × 46 × 61 mm
• Operating temperature: -40℃ to +60℃
• Storage temperature: -40℃ to +85℃
• Temperature control: TEC1

Applications

• Semiconductor inspection
• Sorting and quality control
• Machine vision and industrial inspection requiring SWIR imaging

Technical specifications

• Model: NS-615A-GE
• Sensor type: InGaAs
• Spectral response: 0.9–1.7 μm
• Resolution: 640 × 512
• Pixel pitch: 15 μm
• Interface: GigE
• Lens mount: C-Mount