QFN test socket HC-C

QFPSOP

Seiken HC-C (High-Current) IC Socket — Precision, Power, and Performance Engineered for high-current and high-power device testing, Seiken’s HC-C IC Socket is designed to deliver outstanding current-carrying performance, superior heat dissipation, and long-term reliability under demanding test conditions. With its proprietary spring structure, each terminal achieves exceptional electrical contact stability and current capacity, ensuring consistent performance for power semiconductor evaluation and burn-in testing. Advanced High-Current Design for Power Device Testing Unlike conventional IC sockets that use resin housings, Seiken’s innovative metal housing option for high-current areas—such as around emitter electrodes—dramatically improves both thermal conductivity and current flow efficiency. This design effectively reduces heat buildup, minimizes terminal degradation (e.g., load loss and reduced spring force), and significantly extends socket lifespan. Additionally, the socket structure can be customized to separate signal extraction between emitter and gate terminals, accommodating complex power module electrode layouts and non-standard lead pitches. Customizable Test Socket Solutions Seiken provides fully tailored IC sockets and inspection fixtures, optimized for your device specifications, test environment, and measurement conditions. Our one-stop design-to-manufacturing service supports everything from prototype development to mass production, enabling flexible and cost-efficient adoption across diverse semiconductor test setups. Key Advantages: •High-Current & Heat Dissipation Performance: Metal housing and optimized spring structure ensure stable contact, low resistance, and efficient heat transfer—ideal for high-power IC and transistor testing. •Durability & Stability: Maintains consistent contact force under repeated high-current cycling. •Flexible Custom Design: Adaptable to any package type, electrode layout, or device geometry. •Prototype to Production: Start from a single unit and scale seamlessly. •Comprehensive Testing Compatibility: Perfect for high-current evaluation, burn-in, and power cycling tests. HC-C (High Current Cube) Blocks For maximum versatility and scalability, Seiken offers the universal HC-C block—a compact, modular solution ideal for power device inspection and custom test systems. •Compact design: approx. 10 mm per block •High capacity: Up to 8 high-current terminals per block •Total current capacity: Up to 400A per block •Modular configuration: Combine blocks to handle even higher total currents •Flexible arrangement: Easily adapt to any device layout or test requirement This modular design allows efficient customization for power module testing, high-current ICs, and non-standard device pitches—expanding your testing flexibility and reducing overall cost. Key Technical Specifications: - High-current capacity per terminal. - Standard and metal housing options for terminals - Customizable for individual signal extraction (emitter/gate) - Universal HC-C block. - Supported pitch: 0.3mm (25A resin/40A metal), 0.4mm (50A resin/75A metal) - Suitable for power modules, transistors, SON, SOP, QFN, QFP and other packages. - Custom design and flexible production (from single unit to mass production)