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IC device test socket
Kelvindirect-contact

IC device test socket - Seiken Co., Ltd. - Kelvin / direct-contact
IC device test socket - Seiken Co., Ltd. - Kelvin / direct-contact
IC device test socket - Seiken Co., Ltd. - Kelvin / direct-contact - image - 2
IC device test socket - Seiken Co., Ltd. - Kelvin / direct-contact - image - 3
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Characteristics

Applications
for IC devices
Options
Kelvin, direct-contact

Description

Seiken Kelvin IC Sockets — Precision Four-Terminal (Kelvin) Measurement Solutions Seiken’s Kelvin IC Sockets are engineered for high-accuracy, low-resistance measurements using the four-terminal (Kelvin) connection method. Developed to meet the demands of advanced semiconductor testing, these sockets enable precise resistance evaluation beyond the limitations of conventional two-terminal methods—making them essential for precision device characterization and high-current testing. Optimized for miniaturized and high-density IC packages, including chips smaller than 1mm², Seiken’s Kelvin sockets deliver stable, repeatable performance across a wide range of semiconductor test environments. Accurate Low-Resistance Testing with Kelvin Measurement Kelvin measurement requires highly specialized socket and fixture designs. Seiken’s sockets are purpose-built for four-terminal testing, ensuring accurate separation of current and voltage paths, minimizing measurement error caused by lead resistance. This makes them ideal for ultra-low resistance evaluation, current-voltage characteristic testing, and precision electrical inspection in R&D and production environments. Key benefits include: •True Kelvin accuracy: Enables micro-ohm-level precision for low-resistance measurements. •Fine-pitch compatibility: Perfect for high-density, small-footprint devices. •Stable, repeatable contact: Designed to maintain long-term consistency under high-frequency or high-current conditions. Customizable Layouts for Complex and Multi-Chip Testing Seiken’s custom Kelvin IC Socket designs support fully flexible pin configurations, accommodating unique device geometries and multi-electrode structures. As long as the pitch requirements are satisfied, sockets can be tailored to measure between 100 and 1000 electrodes per chip, or even perform simultaneous multi-chip measurements. This adaptability makes Seiken the ideal partner for custom semiconductor test development and specialized power device analysis. Easy Maintenance and Long-Term Usability Designed with practicality in mind, Seiken’s Kelvin sockets feature easy pin replacement and modular construction, ensuring effortless maintenance and minimal testing downtime. Available for prototype development, low-volume production, or custom one-off builds, these sockets provide cost-effective flexibility without compromising measurement accuracy. Technical Specifications: •Supports four-terminal (Kelvin) measurement for high-accuracy resistance testing •Ultra-low resistance measurement capability (micro-ohm level) •Compatible with ultra-compact chips (<1mm²) and fine-pitch devices •Customizable pin layouts for complex, high-density applications •Easy pin replacement and high maintainability •Prototype and small-lot production available (from one unit) •Ideal for precision testing, semiconductor evaluation, and low-resistance measurement

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