QFN test socket

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Seiken Non-Magnetic IC Sockets — Precision Testing Without Magnetic Interference Seiken’s Non-Magnetic IC Sockets are engineered for high-precision, interference-free device testing, ensuring stable electrical contact and uncompromised accuracy in magnetically sensitive applications. Designed for a wide range of semiconductor package types—including leaded, leadless, and ball terminal devices—these sockets deliver reliable, repeatable performance even for ultra-compact chips under 1mm². Ideal for magnetic sensor testing and precision device evaluation, Seiken’s non-magnetic sockets provide the perfect solution for applications where even minimal magnetic influence can distort measurements. High-Precision, Non-Magnetic Performance Constructed entirely from non-magnetic materials, these sockets eliminate unwanted magnetic interference, ensuring stable signal accuracy during sensitive device evaluations. They are especially suited for electronic compasses, Hall ICs, MR (Magneto-Resistive) sensors, and MI (Magneto-Inductive) sensors, where measurement precision and magnetic neutrality are critical. Key advantages include: •Magnetic-field neutral design: Minimizes distortion caused by ferromagnetic materials. •Exceptional contact reliability: Maintains high repeatability and precision across extended testing cycles. •Compatible with magnetic field test environments: Ideal for use in clean, shielded, or magnetically controlled labs. Custom Design and Full In-House Production Seiken offers complete customization—from concept and design to machining, assembly, and inspection—all handled entirely in-house. This guarantees quality consistency, rapid turnaround, and optimized socket performance tailored to your device structure, test environment, and evaluation conditions. Whether you require a prototype IC socket, low-volume production, or a custom test fixture for specialized sensors, Seiken provides flexible, made-to-order solutions that meet your exact specifications. Flexible Support for Fine-Pitch and Specialty Devices Seiken’s advanced fine-pitch probe pin array technology enables accurate, stable contact even for devices with tight pad spacing or unconventional geometries. Our proven design supports testing of miniaturized ICs smaller than 1mm², ensuring precision in today’s smallest semiconductor components. Technical Specifications •Fully non-magnetic construction to suppress external magnetic interference •Supports leaded, leadless, and ball terminal device types •Compatible with miniature chips (under 1mm²) •Fine-pitch support for high-density terminals •Custom-tailored design for various device shapes and layouts •Prototype and small-lot production starting from one unit •Suitable for electronic compass, Hall IC, MR/MI sensor, and other precision magnetic testing applications