Gas analyzer DF-745

monitoringmoisturetrace

The TDL DF-745 measures moisture for UHP gas checks Using industry-leading Tunable Diode Laser (TDL) technology, the DF-745 delivers trace and ultra-trace measurements of moisture for ultra-high-purity (UHP) electronic gas checks in LED/LCD manufacturing processes. Flexible TDL trace and ultra-trace measurements A no-compromise solution Simple maintenance and reduced ongoing costs The DF-745 provides trace and ultra-trace moisture contaminant measurements for LED/LCD manufacturing processes. Able to monitor multiple background gases, it delivers exceptional performance operational flexibility in a compact unit. With an intelligent and robust hardware/software design, this analyzer can be moved easily from port to port, virtually eliminating dry down times often associated with these applications. Offering a Lower Detection Limit (LDL) of 1 part-per-billion (ppb), the DF-745 delivers ultra-reliable baseline measurements and a fast speed of response. A robust Herriott cell prevents loss in mirror reflectivity, while moisture contact with optical components is minimized, ensuring an accurate measurement. Zero drift extends calibration intervals while minimal ongoing maintenance provides Flexible TDL trace and ultra-trace measurements Modern LCD and LED manufacturing processes require an ultra-trace quality measurement for moisture contaminants in high purity electronics grade gases. In such a specific application, users need analysis capable of delivering high-accuracy and ultra-low detection limits in multiple background gases.