Oxygen analyzer DF-760E ULTRA

for quality controlmoisturetrace

The DF-760E ULTRA is a dual moisture/oxygen analyzer for UHP gases Delivering industry-leading quality control measurements for UHP bulk gases, the compact DF-760E NanoTrace ULTRA analyzer is a superior solution for the dual measurement of trace and ultra-trace moisture (H2O) and oxygen (O2). High stability TDL trace/ultra-trace measurements A no-compromise solution Simple maintenance and reduced ongoing costs Delivering a compact integrated solution for the simultaneous monitoring of trace moisture and trace oxygen, the DF-760E ULTRA is an analyzer designed for monitoring UHP bulk gases used in the manufacture of integrated circuit boards. Combining the industry-leading properties of Servomex’s non-depleting Coulometric sensor and robust Tunable Diode Laser (TDL) technology within a single compact unit, the DF-760E ULTRA measures ultra-low contaminant levels of H2O and O2 within background gas blends of nitrogen (N2), hydrogen (H2), helium (He), O2 and argon (Ar) (H2O in O2 only). Offering exceptionally low, industry-leading Lower Detection Limits (LDL) of 55ppt (H2O) and 45ppt (O2), the DF-760E ULTRA provides a fast speed of response, unsurpassed stability and immunity from trace acid damage, making it ideal for quality checking and leak detection in semiconductor FAB applications. This unmatched measurement performance is supported by a low-maintenance design, delivered through the resilient zero-drift sensing technologies which require no ongoing calibration. When you work in the manufacture of integrated circuit boards, the quality control of electronics grade UHP gas is crucial.