UV-Vis-NIR spectrophotometer SolidSpec-3700i

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Overview
The SolidSpec-3700i and SolidSpec-3700i DUV are UV-Vis-NIR spectrophotometers equipped with three detectors that cover wavelengths from the ultraviolet to the near-infrared. Instruments include LabSolutions UV-Vis software for instrument control and data acquisition. The DUV variant extends measurement capability into the deep-ultraviolet region and an integrating sphere option is available for diffuse reflectance and deep-UV measurements. The large sample compartment accommodates diverse and oversized samples.

Features

• Three detectors covering UV to NIR for continuous spectral coverage and reduced detector switchover artifacts.
• High sensitivity suitable for accurate transmittance and reflectance measurements.
• DUV variant (SolidSpec-3700i DUV) designed for deep-ultraviolet applications.
• Large sample compartment allowing measurement of cells, cuvettes and large or irregular samples without special preparation.
• Optional integrating sphere for diffuse reflectance and deep-UV region measurements.

Applications

• Comparison of 2-detector and 3-detector instrument configurations.
• High-accuracy transmittance and reflectance measurements with minimized detector switchover noise.
• Measurements in the deep-ultraviolet region (DUV variant).
• Gemstone analysis combining UV-Vis and EDX methods.
• Regulatory spectral evaluations for spectacle lenses (e.g., JIS T7333).
• Selection of optimal solvents and cells for near-infrared measurements.

Downloads

• Product brochure: SolidSpec-3700i / SolidSpec-3700i DUV — UV-VIS-NIR Spectrophotometers (PDF)
• Accessories brochure: UV-Vis series accessories (PDF)
• Additional application notes and technical documents (various PDFs)

Specifications

• Detector configuration: three detectors covering ultraviolet to near-infrared.
• Software: LabSolutions UV-Vis for control, acquisition and analysis.
• Wavelength range: UV to NIR (DUV variant extends into deep UV).
• Sample compartment: large format for varied sample types and measurement modes (transmittance, reflectance, integrating sphere).
• Options: integrating sphere for diffuse and deep-UV measurements.