thickness measuring system / diameter / X-ray / for tubes
Measured physical value:
The dynamic RAYEX® D is a low energy X-ray and high speed scanning system for the measurement of wall thickness, eccentricity, diameter and ovality of multilayer (up to 3 layers) or single layer products in CV lines or others. RAYEX® D is based on the worlds first system which was able to measure all relevant cable parameters from outside the tube looking through beryllium windows.
The static RAYEX® S is a fully new X-ray system based on latest technology and made with top quality. Unconventional solutions reunited in unique advantages, flexibility and high measurement performance: Easy and reliable operation, High accuracy, Longevity, especially of X-ray sources, Easy maintenance and service, High safety level. The systems measures at 4 wall thickness points, 2 diameters, ovality with 2 X-ray sources under 90˚ to each other. There are no moving parts and no water cooling is necessary.
Shorter start-up times
Considerable material savings
"Process transparency" at all times
Seamless QC documentation
The radiation intensity is far below all international limitation standards and, therefore, does not represent a safety problem.
Measures thin semi-conductor and insulation layers down to 0.3 mm (.012 in.)
Simultaneous and uninterrupted scanning in X and Y directions with highest precision
High scan rate and screen update (every 1...3 s)
Multi-colored, easy to understand display
Automatic control, thanks to short measuring intervals
High resolution and accuracy, thanks to "Micro Focus" beam and UMX x-ray source.