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1. Surface contour evaluation: It can evaluate radius, angle, distance, coordinates, circle, circular cross section, and determine the points, each intersectant point, coordinate axis, straight line, vertical line, circle and circular cross section, and ...
Chotest Technology Inc.
The SJ5720-OPT series is a capable to measure both surface roughness and profile after once scanning. Moreover, there is a dedicated software module for measurement and analysis of large aspheric surface, so this series is an ideal measurement solution ...
Chotest Technology Inc.
... SuperView W1 Optical 3D Surface profilometer is an ideal instrument for sub-Nanometer measurement of various precision parts. Based on the principle of white light interference technology, combined with precision Z-direction scanning ...
Chotest Technology Inc.
... Nano 3D Optical Surface Profilometers SuperView W1 Model No.: SuperView W1/W1-Pro Product name: Nano 3D Optical Surface Profilometers Standard field of view: (0.98*0.98)mm Max field of view: (6x6)mm Reflectivity ...
Chotest Technology Inc.
... 1. Once Scanning for both Profile and Roughness parameters such as Ra and Pt 2. Surface roughness: R parameter, P parameter, W parameter, etc. 3. Surface profile evaluation: It can evaluate radius, angle, distance, coordinates, circle, circular cross ...
Chotest Technology Inc.
SJ5780-200 Bidirectional scanning contour measuring instrument is a large-range, high-precision active scanning comprehensive contour measuring instrument. The instrument X-axis, Z-axis with independent motion system, the use of advanced two-axis linkage ...
Chotest Technology Inc.
SJ5780-400 Bidirectional scanning contour measuring instrument is a large-range, high-precision active scanning comprehensive contour measuring instrument. The instrument X-axis, Z-axis with independent motion system, the use of advanced two-axis linkage ...
Chotest Technology Inc.
... SuperView W1 Optical 3D Surface profilometer is an ideal instrument for sub-Nanometer measurement of various precision parts. Based on the principle of white light interference technology, combined with precision Z-direction scanning ...
Chotest Technology Inc.
Measurement range: 0 mm
... Stylus Nano Profiler NS200 is an ultra-precision contact measuring instrument for measurement of surface roughness and microscopic profile, such as micro-nano step height, film thickness.The NS200 uses a displacement sensor with sub-angstrom ...
Chotest Technology Inc.
... Two-Sided Scanning Dedicated for Threaded wrokpieces Features 1.Two-sided profle scanning function It obtains profle of object by scanning the surface with T-shaped stylus, then software can calculate the 2D sizes and GD & T based on the profle. 2.Thread ...
Chotest Technology Inc.