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... 1. Once Scanning for both Profile and Roughness parameters such as Ra and Pt 2. Surface roughness: R parameter, P parameter, W parameter, etc. 3. Surface profile evaluation: It can evaluate radius, angle, distance, coordinates, circle, circular cross ...
Chotest Technology Inc.
... ensure that a large number of steep slopes through the ability of the workpiece leveling operation is simple, and at the same time to avoid chipping the needle, hanging pin and other issues. It can scan continuously over a wide range ...
Chotest Technology Inc.
... SuperView W1 Optical 3D Surface profilometer is an ideal instrument for sub-Nanometer measurement of various precision parts. Based on the principle of white light interference technology, combined with precision Z-direction scanning ...
Chotest Technology Inc.
Measurement range: 0 mm
... Stylus Nano Profiler NS200 is an ultra-precision contact measuring instrument for measurement of surface roughness and microscopic profile, such as micro-nano step height, film thickness.The NS200 uses a displacement sensor with sub-angstrom ...
Chotest Technology Inc.
... Two-Sided Scanning Dedicated for Threaded wrokpieces Features 1.Two-sided profle scanning function It obtains profle of object by scanning the surface with T-shaped stylus, then software can calculate the 2D sizes and GD & T based on the profle. 2.Thread ...
Chotest Technology Inc.
... tools, molds, precision hardware and other industries. Features 1. Evaluate profile and roughness parameters at the same time after once scanning 2. High precision, high stability, and high repeatability 3. Aspheric optical software ...
Chotest Technology Inc.