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... Item No.: VX8100 Product name: Flash Measuring Machine Image Senor: 20M CMOS Field of view：W130mm×L20mm & W200mm×L100mm Depth of Field: 3mm & 30mm Working Distance: 120mm Accuracy: ±2μm(Without stitching) & ±5μm(Without ...
Chotest Technology Inc.
... The CHOTEST Novator333 automates video measuring (AVMM) for superior precision and speed. Its high-resolution camera and double telecentric optics deliver submicron accuracy, while the motorized stage ensures swift measurement ...
Chotest Technology Inc.
... Microscopic measuring machine MX3200 achieves wide-range measurement of tiny features by combining microscopic imaging with traditional video measurement. Equipped with a motorized turret, it can measure various microscopic ...
Chotest Technology Inc.
... UP300 Product name: Universal length measuring machine Inside measuring range: 0.7~900mm Outside measuring range: 0~1040mm Resolution: 0.01μm Repeatability: 0.1μm Max thread pitch: ...
Chotest Technology Inc.
... thread and display data of any position, in addition it generates the thread curve, relevant parameters and analysis chart automatically. 7. Measuring probe and workholder are identified automatically, which avoids ...
Chotest Technology Inc.
... series number + size of measuring gauge + type of measuring gauge, which can be recognized easily. With centralized database management for measuring records, the user can query and manage ...
Chotest Technology Inc.
... for measuring pin positioning: with an easy-to-use buttons control box, the operation is more flexible. 10. User-friendly English software system and simple & convenient operation. 11. Test results ...
Chotest Technology Inc.
... Product name: SJ5500 Universal thread measuring machine Inside measuring range: 2.5~620mm Outside measuring range: 1.0~620mm Resolution: 0.01μm Max measuring length: ...
Chotest Technology Inc.
... Unpatterned Wafer 3D Inspection System WD4000 series can automatically measure wafer thickness, surface roughness, and micro-nano 3D microtopography at a time. Use white light confocal probes to measure wafer thickness, ...
Chotest Technology Inc.
... Patterned Wafer Critical Dimension & Overlay Measurement System is an optical inspection instrument that can perform both high-precision XY plane dimension inspection and sub-nanometer surface 3D topography ...
Chotest Technology Inc.