- Electricity - Electronics >
- Electronic Component >
- IC device test socket >
- Smiths Interconnect
Smiths Interconnect IC device test sockets
{{product.productLabel}} {{product.model}}
{{#if product.featureValues}}{{product.productPrice.formattedPrice}} {{#if product.productPrice.priceType === "PRICE_RANGE" }} - {{product.productPrice.formattedPriceMax}} {{/if}}
{{#each product.specData:i}}
{{name}}: {{value}}
{{#i!=(product.specData.length-1)}}
{{/end}}
{{/each}}
{{{product.idpText}}}
{{product.productLabel}} {{product.model}}
{{#if product.featureValues}}{{product.productPrice.formattedPrice}} {{#if product.productPrice.priceType === "PRICE_RANGE" }} - {{product.productPrice.formattedPriceMax}} {{/if}}
{{#each product.specData:i}}
{{name}}: {{value}}
{{#i!=(product.specData.length-1)}}
{{/end}}
{{/each}}
{{{product.idpText}}}
... Overview
Precision top-and-bottom array
socket designed for simultaneous Package-on-Package (PoP) testing. Suitable for lab, engineering, SLT and ATE environments, the
socket supports high-speed signal testing ...
Smiths Interconnect
... Series sockets are designed for multi-site strip test operations in IC test handlers. They target million-cycle reliability and compatibility with aggressive auto-clean processes commonly ...
Smiths Interconnect
... Overview
Celsius
test
sockets feature a wiping contact technology ideal for QFN testing. The elastomer is utilized for load-board compliance only and allows the contact to be cycled in temperature extremes with ...
Smiths Interconnect
... precision afforded by Smiths Interconnect's floating spring probe designs allows for seamless deployment in testing Wafer Level Chip Scale Packages. We work closely with our customers to develop contactors which are used as probe heads ...
Smiths Interconnect
... oxides on device pad -Short signal path -Tri-Temp socket design to support -55 °C to +150 °C -Configurable design flexibility for integrating into existing hardware setups -Designed for manual test, ...
Smiths Interconnect
... Low Inductance • Optimized design based on test application • Tri-Temp socket design to support -55 °C to +160 °C • Designed for manual test, bench test, and HVM production test ...
Smiths Interconnect
... Low Inductance • Optimized design based on test application • Tri-Temp socket design to support -55 °C to +160 °C • Designed for manual test, bench test, and HVM production test ...
Smiths Interconnect
... mm test height Impedance tuned to match system Consistent stable contact resistance 55 mΩ (Avg.) Hi-coplanarity accommodation Tri-temp socket design to support -55 °C to +150 °C Designed for manual test, ...
Smiths Interconnect
Smiths Interconnect
Subscribe to our newsletter
Receive updates on this section every two weeks.
Please refer to our Privacy Policy for details on how DirectIndustry processes your personal data.