IC device test socket Gutenberg

Overview
Gutenberg Series sockets are designed for multi-site strip test operations in IC test handlers. They target million-cycle reliability and compatibility with aggressive auto-clean processes commonly used in high-throughput production and engineering test environments.

Technology
Smiths Interconnect interposers utilize spring probe contact technology in custom connector designs, enabling high contact density and reliable electrical connection. Mixed-signal routing and multiple functions can be integrated into a single interposer-based connector.

Features & Benefits

• Product stability for repeated mating cycles
• Easy maintenance and serviceability through modular interposer design
• Design flexibility to support mixed-signal and multi-function requirements

Applications

• Multi-site strip test sockets for IC test handlers
• Laboratory, engineering, SLT and ATE test systems with customized connector designs

Technical specifications

• Series: Gutenberg Series
• Designed reliability: million-cycle reliability
• Compatibility: suited to aggressive auto-clean strip test environments
• Contact technology: spring probe contact technology (interposer-based custom connectors)
• Design capability: mixed signals and multiple functions in a single connector
• Key benefits: product stability, easy maintenance, design flexibility