{{#pushedProductsPlacement4.length}} {{#each pushedProductsPlacement4}}
{{product.defLight}}
{{product.productLabel}}
{{product.model}}

{{#each product.specData:i}} {{name}}: {{value}} {{#i!=(product.specData.length-1)}}
{{/end}} {{/each}}

{{{product.idpText}}}

{{#if company.requestButtonsVisibility.requestButtonQuestion == "ACTIVE"}}
{{elseif company.requestButtonsVisibility.requestButtonWhereToBuy == "ACTIVE"}}
{{/if}}
{{productPushLabel}}
{{#if product.innovationType}}
{{else}} {{#if product.newProduct}}
{{/if}} {{/if}} {{#if product.hasVideo}}
{{/if}}
{{/each}} {{/pushedProductsPlacement4.length}}
{{#pushedProductsPlacement5.length}} {{#each pushedProductsPlacement5}}
{{product.defLight}}
{{product.productLabel}}
{{product.model}}

{{#each product.specData:i}} {{name}}: {{value}} {{#i!=(product.specData.length-1)}}
{{/end}} {{/each}}

{{{product.idpText}}}

{{#if company.requestButtonsVisibility.requestButtonQuestion == "ACTIVE"}}
{{elseif company.requestButtonsVisibility.requestButtonWhereToBuy == "ACTIVE"}}
{{/if}}
{{productPushLabel}}
{{#if product.innovationType}}
{{else}} {{#if product.newProduct}}
{{/if}} {{/if}} {{#if product.hasVideo}}
{{/if}}
{{/each}} {{/pushedProductsPlacement5.length}}
focused ion beam probe / FIB
focused ion beam probe / FIB
ZEISS Crossbeam 340 & 540

... performance can be combined with FIB currents up to 100 nA to speed up the nanotomography and nanofabrication. It has an easy-to-understand graphical user inerface and users can benefit from a maximum stability and ...

focused ion beam probe / FIB
focused ion beam probe / FIB
ZEISS AURIGA

... imaging of the surface. It is a system that merged the 3D imaging and analysis of the GEMINI e-Beam that is able to process material through its FIB and prepare samples on a nanoscopic scale. It ...

focused ion beam probe
focused ion beam probe
max. 60 nA, 50 kV | FB-2200 FIB

... the use of this device, including high milling rates and advanced precision. The use of a new aberration ion optical system allows maximum beam current of up to 60nA, with an accelerating voltage ...

focused ion beam probe / FIB
focused ion beam probe / FIB
GCIB 10S

... in combination with XPS and other surface analysis systems. Cluster ion beams enable depth profiling analysis of polymers with minimal loss of chemical information due to ion beam ...

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