Focused ion beam probes

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Focused ion beam probes
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FB-2200 is an advanced device that allows precise and rapid preparation of specimens for both scanning and transmission of semiconductors and other advanced materials. There are numerous features behind the use of this device, including...

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The GCIB 10S is designed for ultimate depth profiling performance in combination with XPS and other surface analysis systems.

Cluster ion beams enable depth profiling analysis of polymers with minimal loss of chemical...

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