Focused ion beam probes

3 companies | 4 products
Focused ion beam probes
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FB-2200 is an advanced device that allows precise and rapid preparation of specimens for both scanning and transmission of semiconductors and other advanced materials. There are numerous features behind the use of this device, including...


The ZEISS Crossbeam 340 and Crossbeam 540 are FIB-SEMs indicated for nanotomography and nanofabrication. Using Crossbeam, imaging and analytical performance...

For the easier way of processing your samples, Zeiss Auriga, a crossbeam work station has produced an FIB-SEM for simultaneous milling and imaging...


The GCIB 10S is designed for ultimate depth profiling performance in combination with XPS and other surface analysis systems.

Cluster ion beams enable depth profiling analysis of polymers with minimal loss of chemical...

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