AURIGA®
Information Beyond Resolution
- Unique Imaging
- Advanced Analytics
- Precise Processing
- Future Assured
Does working with your sample cover more than just ...
The FB-2200 allows for rapid and precise specimen preparation for ...
The JEM-9320FIB Focused Ion Beam System uses an ion beam generated from a gallium (Ga) liquid metal ion source to fabricate specimens. The field-emission electron gun (FEG) provides a high beam current (30nA) with an extremely ...
Miniaturization of feature sizes for Optical Proximity Correction (OPC) masks and phase shift masks is accelerating, according to the International Roadmap for ...
The origin of DIAMONEX's proprietary ion beam equipment dates back to collaborative efforts between DIAMONEX and several notable Russian institutes and laboratories. ...
Spellman's FIBX power supply is an integrated multiple
output high voltage power supply specifically designed for
focused ion beam. Typical applications include transmission and scanning electron microscopy; semiconductor
analysis, milling and repair; disc drive head trimming, ion
beam etching and focused ion-beam lithography.
A modular design approach allows ...
