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Photoemission electron microscope
OMICRON

  • photoemission electron microscope OMICRON
Photoemission Electron Microscopy (PEEM) is an extremely powerful imaging technique, whose versatility for topographical, chemical and magnetic contrast imaging at high resolution has been demonstrated in many laboratory and synchrotron applications.

Important contributions to characterization of magnetic devices, Plasmon research, surface chemistry and high lateral resolution chemical analysis in combination with synchrotron radiation, investigation of time resolved processes and k-space imaging are only a few examples of active PEEM based research. In contrast to a Scanning Electron Microscope (SEM), PEEM directly images surface areas emitting photoelectrons in real-time, without scanning.

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standListOtherProduct www di En 2012-06-22-02