Temperature measurement system IMS-K-mmW/THz
for waferscalibrationrobust

temperature measurement system
temperature measurement system
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Characteristics

Measured physical value
temperature
Measured material
for wafers
Applications
calibration
Other characteristics
robust

Description

Comprehensive, Turn-key Integrated Measurement System (IMS) with Keysight PNA for On-wafer R&D Measurements from RF to millimeter wave to Terahertz FormFactor and partner Keysight applications experts will help you configure a robust, complete solution, including: • FormFactor probe system: CM300xi, SUMMIT200, EPS150RF, EPS150MMW (others available) • Manual, semi-automatic and fully automatic probes station options • FormFactor analytical probes: Infinity, InfinityXT, T-Wave (others available) on manual or motorized positioners • FormFactor calibration accessories: WinCal XE, Impedance Standard Substrate for LRRM, Multiline TRL Cal Substrate calibrations (others avail.) • FormFactor RF automation software: Autonomous RF Measurement Assistant for improved uncertainty and throughput optional) • Full over temperature measurements and automation from -60°C to +200°C • Keysight vector network analyzer and frequency extenders up to 130GHz : N5290A/91A PNA MM-Wave, N524xB PNA-X, N522xB PNA (others available) • Keysight automation and modeling software: WaferPro XP, PathWave, IC-CAP • Virginia Diodes (VDI) Mini frequency extenders for measurement from 75GHz to 1.1THz (optional) • Easy swap RF application arms for mounting RF coax, mm-wave coax, waveguide extenders and load-pull tuners • To complete the system: cables, adapters, mounting hardware, etc.

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*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.