Temperature measurement system IMS-K-LFNfor wafers
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Characteristics
- Measured physical value
- temperature
- Measured material
- for wafers
Description
Comprehensive, Turn-key Integrated Measurement System (IMS) with Keysight A-LFNA
for On-wafer R&D Advanced Low-Frequency Noise Measurements
FormFactor and partner Keysight applications experts will help you configure a robust, complete solution, including:
• FormFactor probe system: CM300xi-ULN, SUMMIT200 (others available)
• Manual, semi-automatic and fully automatic probes station options
• FormFactor analytical probes: DCP probes (others available) on manual or motorized positioners
• FormFactor DC automation software: Autonomous DC Measurement Assistant for unattended probing over temperature on small pads
• Full over temperature measurements and automation from -60°C to +300°C
• Keysight advanced low-frequency noise analyzer (A-LFNA): E4727B
• Keysight automation and modeling software: PathWave WaferPro (WaferPro Express)
• To complete the system: cables, adapters, mounting hardware, etc.
Industry’s Most Productive and Accurate Advanced Low-Frequency Noise Measurement System
On-wafer 1/f noise measurements are a critical component of any characterization and modeling test system. Due to the required sensitivity, such testing can be easily corrupted by interference from outside or inside the test system.
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*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.