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Latch-lock test socket DCL-QFP1414-100-P050QFPSOPdirect-contact
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Characteristics
- Applications
- QFP, SOP
- Options
- direct-contact, latch-lock
Description
The test socket that enables high-speed transmission signal measurement by adopting the contact method that directly presses the device lead against the board.
The "Latch Lock type" that fixes the lid of the socket with a latch allows you to replace the device efficiently because the lid can be attached and detached simply by pressing it from above.
We have a lineup of standard products that match the dimensions of QFP/SOP devices, and can be delivered in a short period of time.
[Application]
- Mounting on PCB for mass-production
- Final test and inspection at real environment
(ex. automobile, robotics, electrical devices for mobility)
- IC failure analysis
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Direct Contact Socket
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*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.