Validation software package PowerTest Int V7.0

simulationverificationfor test

Overview
PowerTest Int V7.0 is a universal relay test software for Ponovo new-generation relay test sets (examples: L336EXi series, PW366Ai, PNS330i series). The application supports simultaneous analog and digital output or selectable output types depending on configuration, and provides dedicated functional pages to perform protection, MU and IEC-compliant tests.

Test Function Page

• Organizes tests into packages: Basic Function, Protection Function, Advanced Test and Others.
• Basic Function: QuickTest, QuickTest Sequence, QuickTest (VL-L, 3I), QuickTest (Power), QuickTest (Z), State Sequence, Harmonic, Ramp and Time test modules.
• Protection Function: Distance, Distance Search, Auto-Reclosing, Directional, Voltage Relay, Frequency Relay, Time Inverse Current, Time Inverse Voltage, Synchronizer, Differential and Differential Configuration modules.
• Advanced Test: TransPlay, CB Operate, Power Swing Simulation, Ramp (Sequence), Ramp (VL-L, 3I), Ramp (Fault), IEC Detect, SCD Compare, SMV/GOOSE abnormal simulation modules.
• Others: Transducer and Energy Meter test modules for auxiliary testing needs.

MU Test Page

• MU (Merging Unit) tests include Steady-state, Transient and Time test packages.
• Steady-state: MU stated accuracy and automatic MU accuracy tests.
• Transient: first-cycle test, peak error test and attenuating constant (latter two noted as under development in some versions).
• Time: MU time synchronization and MU time-keeping verification modules.

SCL file Page

• Import and manage SCL files for IEC configuration. Supported formats: .scd, .icd, .cid, .tscd, .ccd.

Template Page

• Create, open and refresh test templates to standardize and accelerate test procedures.

Device Manage Page

• Displays hardware and device-related information for identification and management of connected test sets.

Additional Information

• Software name/version: PowerTest Int V7.0
• Designed as a universal client for multiple Ponovo relay test sets (e.g., L336EXi, PW366Ai, PNS330i)
• Output capability: simultaneous analog and digital outputs or selectable output type
• Main pages: Test Function, MU Test, SCL file, Template, Device Manage
• Supported SCL formats: scd, icd, cid, tscd, ccd

Technical specifications

• Software: PowerTest Int V7.0
• Compatible test sets: L336EXi series, PW366Ai, PNS330i series and other Ponovo new-generation sets
• Output: Analog and digital (simultaneous or separate)
• Test packages: Basic Function, Protection Function, Advanced Test, Others (Transducer, Energy Meter)
• MU tests: steady-state accuracy, transient (first-cycle, peak error, attenuating constant), time synchronization and keep time checks
• Brochure: PowerTest Int Brochure (PDF)