Coupling testing machine CT1000-SiPh

automaticCNCmaterial

Overview
CT1000-SiPh is a silicon optical chip testing equipment engineered for high-volume industrial production. The system combines a dedicated testing section and a loading/unloading section to enable fast, accurate coupling and measurement of fiber arrays (FA) to silicon optical chips. It integrates a high-resolution vision system, a high-precision coupling mechanism and dynamic closed-loop force control to maintain measurement consistency and throughput.

Key features

• High-resolution vision system (50 nm visual resolution)
• High-precision coupling mechanism for FA-to-chip alignment
• Dynamic closed-loop force control for fast, repeatable coupling
• Highly compatible design supporting multiple chip types and interfaces
• Automated basket loading/unloading for production throughput

Advantages

• Independent air-bearing damping on the test section to isolate external and load/unload vibrations
• Basket-style automated handling suitable for volume production
• End-pressure feedback for accurate process control and monitoring
• Support for hot-air film expansion and related processes

Application areas

• Photonics
• Power devices
• Microwave RF devices
• New energy vehicles (powertrain and sensing modules)

Specifications

• Trolley capacity: 25 pieces 8-inch wafer ring
• Visual resolution: 50 nm
• Equipment weight: approx. 1300 kg
• Positive pressure source: pressure ≥ 0.5 MPa; receiver caliber: 8 mm
• Negative pressure source: vacuum degree ≤ -80 KPa; receiver caliber: 8 mm (optional vacuum pump)