Capacitance tester TR8100 SII

performancevoltagecontinuity

Introduction
The TR8100 SII is an in-circuit tester (ICT) designed for high-throughput, high-accuracy testing of large and complex PCB assemblies. It targets low-voltage device testing and uses a vacuum fixture to ensure full pin contact. The non-multiplexing per-pin digital architecture supports up to 11088 pins (TR8100L SII) to accelerate test execution and simplify program development. Built-in self-diagnostics support long-term production reliability.

Features

• High fault coverage enabled by vacuum fixture
• Optimized for low-voltage device testing with rapid test speed
• Built-in self-diagnostics for uptime monitoring
• High-accuracy measurement and analog testing
• Operator-friendly UI for efficient program development
• Auto-calibration via integrated DMM

Tester Specifications
Max. Test Points: TR8100 SII: 3584 (optional 7056); TR8100L SII: 11088
Operating System: Microsoft® Windows 11
Fixture Type: Vacuum fixture for full-pin contact
Max. PCB Size: TR8100 SII: 790 × 640 mm; TR8100L SII: 990 × 640 mm

Standard Testing Components

• Analog test hardware
  • 6-wire measurement switching matrix
  • Programmable AC/DC high-voltage and current sources
  • AC/DC voltage, DC current and frequency measurements
  • Component R/L/C measurement
  • Synthesized arbitrary waveform generator (AWG)
  • TestJet vectorless open-circuit detection
• Digital testing
  • Non-multiplexing 1:1 per-pin architecture with independent per-pin level setting
  • DUT power supplies — Fixed: +5V@5A, +3.3V@5A, +12V@5A, +12V@1A; Programmable: +0.2V~+20V@3A (2 sets), -3V~-20V@3A (2 sets)
  • On-board Flash and EEPROM memory test support

Industry 4.0
Communication standards: SMEMA, SECS/GEM, IPC-CFX-2591, IPC-HERMES-9852
Yield management: YMS 4.0 (optional)

Optional Components

• Analog: Fixture conversion kits for Teradyne, GenRad
• Digital: APPS programmable power supplies (up to 75 V/8 A/200 W per channel), BScan/chain/cluster/virtual nails tests, IEEE1149.6, STC programming
• DPS programmable DUT supply options:
  (1) DPS3514: 30 V max / 5 A max / 100 W max per channel — 4 CH per DPS
  (2) DPS3122: 30 V max / 10 A max / 200 W max per channel — 2 CH per DPS
  (3) SPS5450: 54 V max / 50 A max / 2400 W max per channel — 1 CH per rack
• ToggleScan test
• VregTest™: multi-phase PWM individual phase frequency & duty P/N measurements

System Requirement
Power: 200–240 V, single phase, 50/60 Hz, 4 kVA
Power features: Earth ground auto-detection; 50/60 Hz auto-detection
Air: Dry air 4–8 kg/cm²
Vacuum: Min. -0.86 bar (-12.6 psi); exhaust: 70 m³/h

Dimensions
WxDxH: TR8100 SII: 1150 × 850 × 800 mm; TR8100L SII: 1400 × 850 × 800 mm
Weight: TR8100 SII: 400 kg; TR8100L SII: 470 kg

Standard Testing Components (summary)

• Analog switching matrix and programmable sources
• High-accuracy measurement, R/L/C measurement, AWG
• Digital non-multiplex 1:1 per-pin architecture with fixed and programmable DUT supplies
• On-board memory test support

Technical Specifications

• Model: TR8100 SII (also TR8100L SII variant)
• Max. Test Points: TR8100 SII: 3584 (optional 7056); TR8100L SII: 11088
• Operating System: Microsoft® Windows 11
• Fixture Type: Vacuum fixture (full-pin contact)
• Max. PCB Size: TR8100 SII: 790 × 640 mm; TR8100L SII: 990 × 640 mm
• DUT fixed supplies: +5V@5A, +3.3V@5A, +12V@5A, +12V@1A
• Programmable DUT supplies: +0.2V~+20V@3A (2 sets); -3V~-20V@3A (2 sets)
• Analog: 6-wire switching matrix, AC/DC sources, frequency & R/L/C measurement, synthesized AWG
• Digital: Non-multiplexing 1:1 per-pin with independent per-pin level setting
• Optional DPS models: DPS3514, DPS3122, SPS5450 (specifications as listed above)
• Industry communication: SMEMA, SECS/GEM, IPC-CFX-2591, IPC-HERMES-9852
• Power requirement: 200–240 V, single phase, 50/60 Hz, 4 kVA
• Air requirement: Dry air 4–8 kg/cm²
• Vacuum requirement: Min. -0.86 bar, exhaust 70 m³/h
• Dimensions (WxDxH): TR8100 SII: 1150 × 850 × 800 mm; TR8100L SII: 1400 × 850 × 800 mm
• Weight: TR8100 SII: 400 kg; TR8100L SII: 470 kg