Magnetic moment measurement system DXV-9000

magneticautomatedfor semiconductors

Overview

The DXV-9000 series vibrating sample magnetometer (VSM) is designed for precise magnetic moment, hysteresis and temperature-dependent measurements on a wide range of samples. The system features a continuous 360° electric rotating vibrating head, fast data acquisition and optional high- and low-temperature modules for Curie and superconducting transition tests.

Functions and features

• Measurement of magnetic hysteresis loops (M-H) to obtain coercive force, remanent magnetization, saturation magnetization and moment.
• M-T curve measurement with low-temperature option for superconducting transition and high-temperature option for Curie point determination.
• Standard 360° continuous electric rotation of the vibrating head for anisotropy studies.
• Sample positioned at the center of the pickup coil and field for improved anisotropic measurements versus superconducting-magnet setups.
• Electromagnet pole-gap adjustment and electric lifting system for automated vertical centering, improving repeatability and centering accuracy.
• High-speed acquisition: continuous sampling down to 10 ms/point; supports field change rates up to 5000 Oe/s and hysteresis loop acquisition in ~14 s; FORC-capable.
• Closed-loop vibration control with laser displacement sensor detecting amplitude variations ~1 μm and long-term amplitude stability (example: 4 μm stability over 24 h at 8 mm amplitude).
• Integrated replacement/alignment device to protect sample rods and ensure collision-free vertical vibration; vector moment tests supported with temperature options.
• Patented sample pole electrical lead for applying an electric field during magnetic measurement and integrated pickup coil with Gauss probe for compact, reliable connections.
• Single-hand sample replacement design and one-key software test via user-friendly HMI.
• Applicable sample types: diamagnetic, paramagnetic, ferromagnetic, ferrimagnetic, antiferromagnetic and anisotropic materials; particulate and continuous magnetic recording materials; GMR, CMR, exchange-biased and spin-valve materials; magneto-optical materials; bulk, powders, thin films, single crystals and liquids.

Configurations

• Variable gap electromagnet (e.g., DXSB-130 for DXV-9005; DXSB-178 for DXV-9007)
• Electromagnet bipolar power supply (e.g., DXEP-7050 / DXEP-9060)
• Lock-in amplifier for data acquisition
• Vibrating head and support
• Sample rods, holders and fixtures for block, powder, film and liquid samples
• Calibration sample (moment standard)
• Computer with system software
• Chiller for cooling electromagnet and PSU (RG0309)
• High-temperature system (RT-873K)
• Low-temperature system (approx. 80 K–350 K) — variants noted as in development on certain pages

Temperature options

• Low temperature: ~80 K to 370 K (flowing nitrogen environment; resolution ~0.001 K; stability ±0.1 K).
• High temperature: ~350 K to 1050 K (static argon or equivalent; typical resolution/accuracy varies by option: ±0.1 K to ±1 K).

Technical specifications

• Moment noise examples: at room temperature @3.5 mm: 0.1 s/pt (RMS) = 150 μemu, 0.1 s/pt (P-P) = 800 μemu; 1 s/pt (RMS) = 80 μemu; 10 s/pt (RMS) = 35 μemu. Noise floor down to ~4×10⁻⁸ emu (10 s/pt) claimed.
• Measuring range: ~35×10⁻9 to 10³ emu.
• Stability: ±0.05% of full scale/day after thermal equilibrium (fixed coil spacing).
• Repeatability: ±0.5% (loading/unloading tests).
• Accuracy: ±1% (compared with NIST 772a standard sample).
• Maximum sample mass: 0–10 g (larger masses reduce amplitude and SNR).
• Data acquisition interval/mode: 0.01–10 s (continuous mode down to 10 ms); lock-in time constant 100 ms; low-pass 24 dB/oct; vibration amplitude 2–8 mm; frequency 55–85 Hz.
• Magnetic field: examples for DXV-9005/DXV-9007 — small air gaps yield peak fields up to ~2.7–3.0 T depending on gap and pole material (Fe-Co pole option slightly higher).
• Field accuracy ~1%; field resolution 1 mOe; lifting accuracy 0.1 mm; lifting range 0–300 mm.
• Rotation: continuous 360° with angular accuracy ~0.01°; repeatability ~100 mOe.
• Supported field change rate up to 5000 Oe/s.
• Sample holders/rods for block, powder, films (in-plane/out-of-plane) and liquids; example sizes: block Φ4×10 mm; films e.g., 10×6.4 mm; liquids Φ2.5×10 mm. High-temp rods: quartz; low-temp rods: carbon fiber.
• Temperature environments: low-temp uses flowing nitrogen; high-temp uses static argon or vacuum/multi-layer insulation depending on configuration.